Kolesnikov, D. A. ., and S. I. Kucheev. “Distribution Imaging of Charge Implanted into SiO2/Si Using a Focused Ion Beam by a Liquid Crystal Cell”. Applied Mathematics & Physics, vol. 58, no. 2, June 2026, pp. 195-0, doi:10.52575/2687-0959-2026-58-2-195-205.